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SNJ54BCT8374AFK

4.5V ~ 5.5V

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SCAN TEST DEVICES WITH OCTAL D-T

Specifications

Brand: Texas Instruments
Package: 28-CLCC
Packaging: —
Weight: —

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0pcs

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Purchase Quantity

MOQ: 1 pcs

Certifications & Authorizations

Product Video

Discover how SNJ54BCT8374AFK from Texas Instruments fits into your design. Our component experts walk through key specifications, quality certifications, and typical application scenarios.

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Technical Specifications

Manufacturer	Texas Instruments
Series	54BCT
Logic Type	Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage	4.5V ~ 5.5V
Number of Bits	8
Operating Temperature	-55°C ~ 125°C
Mounting Type	Surface Mount
Package / Case	28-CLCC
Supplier Device Package	28-LCCC (11.43x11.43)