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4.5V ~ 5.5V
OriginalGlobal SourcingFast DeliveryQuality CertifiedTechnical SupportBulk Discount
SCAN TEST DEVICES WITH OCTAL BUF
Specifications
- Brand
- Texas Instruments
- Package
- 28-CLCC
- Packaging
- —
- Weight
- —
Total Inventory
0pcs
Ship within 8 hours
MOQ: 1 pcs
Certifications & Authorizations
Product Video
Discover how SNJ54BCT8240AFK from Texas Instruments fits into your design. Our component experts walk through key specifications, quality certifications, and typical application scenarios.
- Authentic sourcing with full traceability
- Rigorous incoming quality inspection
- Competitive pricing & global fast delivery
- Dedicated application engineering support
Technical Specifications
| Manufacturer | Texas Instruments | |
| Series | 54BCT | |
| Logic Type | Scan Test Device with Inverting Buffers | |
| Supply Voltage | 4.5V ~ 5.5V | |
| Number of Bits | 8 | |
| Operating Temperature | -55°C ~ 125°C | |
| Mounting Type | Surface Mount | |
| Package / Case | 28-CLCC | |
| Supplier Device Package | 28-LCCC (11.43x11.43) |
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