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4.5V ~ 5.5V
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IC SCAN TEST DEVICE W/FF 24-SOIC
Specifications
- Brand
- Texas Instruments
- Package
- 24-SOIC (0.295", 7.50mm Width)
- Packaging
- —
- Weight
- —
Total Inventory
405pcs
Ship within 8 hours
MOQ: 1 pcs
Certifications & Authorizations
Product Video
Discover how SN74BCT8374ADWR from Texas Instruments fits into your design. Our component experts walk through key specifications, quality certifications, and typical application scenarios.
- Authentic sourcing with full traceability
- Rigorous incoming quality inspection
- Competitive pricing & global fast delivery
- Dedicated application engineering support
Technical Specifications
| Manufacturer | - | |
| Series | 74BCT | |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |
| Supply Voltage | 4.5V ~ 5.5V | |
| Number of Bits | 8 | |
| Operating Temperature | 0°C ~ 70°C | |
| Mounting Type | Surface Mount | |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) | |
| Supplier Device Package | 24-SOIC |
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