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SN74BCT8374ADW

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Part Number

SN74BCT8374ADW

Manufacturer

Texas Instruments

Description

IC SCAN TEST DEVICE W/FF 24-SOIC

Lifecycle

Active

RoHS

No RoHS Information

EDA/CAD Models

SN74BCT8374ADW PCB Footprint and Symbol

Warehouses

USA, Europe, China, Hong Kong SAR

Estimated Delivery

Sep 28 - Oct 3 (Choose Expedited Shipping)

Warranty

Up to 1 year [Limitety]*

1
In Stock:449 pcs

运送服务:

SN74BCT8374ADW 规格

Logic Type
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Manufacturer
Mounting Type
Surface Mount
Number of Bits
8
Operating Temperature
0°C ~ 70°C
Package / Case
24-SOIC (0.295", 7.50mm Width)
Series
74BCT
Supplier Device Package
24-SOIC
Supply Voltage
4.5V ~ 5.5V

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